School of Engineering and Technology, (SET)

AT81.02 : Digital Integrated Circuit Design  3(2-3)

To provide fundamental concepts in digital systems design. To provide a basic understanding of some computer-aided techniques used in the design verification, synthesis, optimization, and implementation of digital systems.

Catalog Description:

Digital Systems Design Process and CAD Tools. Combinational and Sequential Circuits Design and Implementation. Input/Output Design and Clock Generation. Design of Memory. Hardware Description Language (HDL). Rapid Prototyping and Implementation of Digital Systems. Memory System Design and Test. Testing and Design for Testability (DFT).



Course Outline:
I.             Introduction
1.      Design of static CMOS, nMOS and BiCMOS inverters
2.      Calculation of noise margins, power dissipation and gate delays
II.          Review of Logic Design Fundamentals
1.      Combinational Logic Design
2.      Logic Simplification and Synthesis
3.      Sequential Logic Design
4.      Finite State Machine Design and Implementation
III.       Design of Combinational Circuits
1.      Static CMOS Design
2.      Dynamic CMOS Design
3.      Power Consumption in CMOS Gates
IV.       Design of Sequential Circuits  
1.      Static Sequential Circuits
2.      Dynamic Sequential Circuits
V.          Design of I/Os and Clock Generation
1.      I/O Structures
2.      PLL, clock generation and clock buffering
VI.       Design of Memory
1.      Memory Core
2.      Memory Peripheral Circuits
3.      Memory Faults and Test Patterns
VII.    Digital System Design using Hardware Description Language
1.      Introduction to HDL, Modeling and Designing with VHDL
2.      VHDL Description of Combinational Networks
3.      VHDL Description of Sequential Networks
4.      VHDL Model for Memories
VIII.Rapid Prototyping and Implementation of Digital Systems
1.      Field Programmable Gate Arrays (FPGA), Complex Programmable Logic Devices (CPLD)
2.      Logic Synthesis for FPGA and CPLD
IX.       Testing and Design for Testability (DFT)
1.      Boundary-Scan Test
2.      Faults & Fault Simulation
3.      Automatic Test-Pattern Generation
4.      Scan Test & Built-in Self-test
Laboratory Sessions:
Laboratory1:  Adder and Counter Using VHDL coding
Laboratory 2:  4bit Adder and 4bit Counter with Test bench and Verification
Laboratory 3:  Traffic Light Design and Implementation
Laboratory 4:  Dice Game Design and Implementation
Laboratory 5:  Traffic Light Implementation to FPGA
Laboratory 6:  Dice Game Implementation to FPGA
J. M. Rabaey, A.Chandrakasan, B. Nikolic :
Digital Integrated Circuits (2nd Edition) 2003.
N. Weste:
CMOS VLSI Design: A Circuits and Systems Perspective (3rd Edition) 2004.
C. H. Roth, Jr.:
Digital Systems Design Using VHDL, (2nd Edition) C-L Engineering, 2007.
Michael J. S. Smith:
Application-Specific Integrated Circuits, Addison-Wesley, 1997.
IEEE Transactions on VLSI Systems
IEEE Journal of Solid State Circuits
Kluwer Journal of VLSI Signal Processing
Taylor and Francis Journal of VLSI Design
Elselvier journal of Microprocessors and Microsystems
Elselvier Journal of Microelectronics
Grading System:
The final grade will be computed from the following constituent parts:
Mid-term exam (30%),
Final exam (35%),
Laboratory experiments (25%) and
Assignments (10%).
Open-book examination is used for both mid-term and final exam.