School of Engineering and Technology, (SET)

AT81.03 : Advanced Semiconductor Device Theory  3(3-0)

The purpose of this course is to explore in detail the behavior of CMOS and bipolar transistors with emphasis on those parameters and performance factors that are particularly important for VLSI devices of deep-submicron dimensions.

Catalog Description:

Modern VLSI Devices. Design of VLSI Devices. CMOS Device Design. CMOS Performance Factors. Bipolar Device Design. Bipolar Performance Factors. Advanced Semiconductor Devices.



Course Outline:
I.             Introduction
1.      Evolution of VLSI Device Technology
2.      Modern VLSI Devices
II.          Basic Device Physics
III.       MOSFET Devices
1.      Long-Channel MOSFETs
2.      Short-Channel MOSFETs
IV.       CMOS Devices Design
1.      MOSFET Scaling
2.      Threshold Voltage
3.      MOSFET Channel Length
V.          CMOS Performance factors
1.      Basic CMOS Circuit Elements
2.      Parasitic Elements
3.      Sensitivity of CMOS Delay to Device Parameters
4.      Performance Factors of Advanced CMOS Devices
VI.       Bipolar Devices Design
1.      Design of the Emitter, Base and Collector Regions
2.      Modern Bipolar Transistor Structures
VII.    Bipolar Performance factors
1.      Bipolar Device Optimization for Digital Circuits
2.      Bipolar Device Scaling for ECL Circuits
3.      Bipolar Device Optimization and Scaling for Analog Circuits
Y. Taur, T. H. Ning:
Fundamentals of Modern VLSI Devices, (2nd edition) 2009.
D. J. Roulston:
Bipolar Semiconductor Devices, McGraw Hill, 1990.
M. Zambuto:
Semiconductor Devices, McGraw Hill, 1988.
D. R. Askeland:
The Science and Engineering of Materials, 5rd Edition, Thomson, 2005.
IEEE Circuits and Devices Magazine
IEE Electronics Letters
IEEE Journal of Solid-State Circuits
IEEE Transactions on Circuits and Systems
IEEE Transactions on Electron Devices
Grading System:
The final grade will be computed from the following constituent parts:
Mid-term exam (40%)
Final exam (50%), and
Assignments (10%).
Open-book examination is used for both mid-term and final exam.