School of Engineering and Technology, (SET)

AT81.04 : Recording Head Technology  2(2-0)
Course Objectives:

This course introduces the students to recording head technology in hard disc drive industry.   It covers both current recording technology and future technology with practical process in Hard Disk Drive (HDD) manufacturing.

Learning Outcomes:

Magnetic Recording Basics. Magnetic Recording Heads. Thin Film Head Fabrication. Tests of Recording Heads. Basic Disk Drives.    The Giant Magneto-Resistive (GMR). Effect. Spin Valve (SV) Head. GMR Design.

Pre-requisite(s):

None

Course Outline:
I.             Magnetic Recording Basics
1.      Magnetism
2.      Recording Process
3.      Magnetic Circuit
 
II.          Magnetic Recording Heads
1.      Thin Film Inductive Head
2.      Magneto-resistive (MR) Effect
3.      MR Head
4.      Optical Kerr Effect
5.      Magneto-optical Head
 
III.       Thin Film Head Fabrication
1.      Slider Process
2.      Wafer Process
 
IV.       Tests of Recording Heads
1.      Static and Dynamic Electrical Test
2.      Fly Height Test
 
V.          Basic Disk Drives
1.      Servo Positioning
2.      Read/Write Interfaces
  
VI.       The Giant Magneto-Resistive Effect
1.      Exchange Coupling
2.      Ferro and Anti-Ferro Magnetic Properties
3.      Physical GMR Effect & Coefficient
4.      MR vs. GMR Comparison
 
VII.    Spin Valve (SV) Head
1.      SV Physics
2.      SV Head Configuration
3.      SV Transfer Curve
4.      Reader Sensitivity
 
VIII.GMR Head Designs
1.      Areal Density Perspective
2.      Future Head Designs
Textbook:

Lecture Notes

Reference Books:
D. R. Askeland:
The Science and Engineering of Materials, 5th Edition, Thomsom, 2005.
 
D. A. Bell:
 Fundamentals of Electric circuits, 4th Edition, Prentice Hall, 1998.
 
J. C. Mallinson:
Magneto-Resistive and spin-valve Heads, Fundamentals and Applications, Academic Press, 2001.
 
D. Mee:
          Handbook of Magnetic Recording, McGraw-Hill, 1996.
Journals and Magazines:
Insight, IDEMA Publication
IEEE Transactions on Magnetism
IEEE Transactions on Industrial Electronics
Evaluation Scheme:
The final grade will be computed from the following constituent parts:
 
Mid-term exam (30%)
Final exam (50%) and
Assignments/fieldtrip report (20%).
 
Closed-book examination is used for both mid-term and final exam.
Instructor(s):
SECTION NAME
B