School of Engineering and Technology, (SET)
 
AT76.17 : Spatial Analysis Methods in GIS  2(2-0)
 
Course objectives:

This course will familiarize students with advanced topics of spatial database accuracy assessment, spatial modeling, analysis of discrete and continuous entities in space and Spatial Decision Methods. There will be special emphasis on statistical analysis of spatial data. Students will be trained to develop models based on regression analysis and logical analysis.
 
Learning Outcomes:

Development in GIS Technology, Accuracy Assessment of Spatial Data, The Analysis of Discrete Entities in Space, The Spatial Analysis using Continuous Fields, Analytical Hierarchical Processing, Information Value, Pattern Descriptors.
 
Pre-requisite(s):

AT76.01 (Geographic Information Systems)
 
Course Outline:
I.    Introduction to Advances in GIS Technology
1.      State of the Art of GIS Technologies
2.      Main Application Topics

II.     The Analysis of Discrete Entities in Space
1.      Operations on Attributes of Geographic Objects
2.      Attribute Descriptors
3.      Point Descriptors: Central Tendency, Dispersion and Distribution
4.      Operations on Attributes of Multiple Overlapping Entities in Space
5.      Cartographic Operations
6.      Pattern Detectors: Nearest Neighbor Analysis, Application
7.      Characteristics of Linear Features: Network Analysis
8.      Directional Statistics

III.   The Spatial Analysis using Continuous Fields 
1.      Map Algebra and Cartographic Modeling
2.      Point Operations
3.      Spatial Analysis Using Convolution
4.      Deriving Surface Topology and Drainage Networks
5.      Spatial Regression Analysis and Modelling
IV.    Analytical Hierarchical Processing
1.      Introduction
2.      Ranking matrix, Random Index and Evaluation of consistency ratio
3.      Multi-Criteria decision making
4.      Case Studies

V.     Information Value Approach
1.      Introduction
2.      Bayesian Algorithm for Information Value Index
3.      Case Studies

VI.    The Spatial Pattern Descriptors
1.      Spatial Relationship
2.      Spatial Autocorrelation
3.      Scatter Plots – Moran
4.      Spatial Indices
 
 
Learning Resources:

Textbook:
Lecture Notes
 
Roger Tomilson (2007):
            Thinking about GIS, ESRI Press. Redlands, California.

P.A. Burrough and R. A. McDonnell (1998):
            Principles of Geographic Information Systems, Oxford University Press.

J. Lee, D.W.S. Wong (2002):
            Statistical Analysis with Arc View GIS: John Wiley and Sons, Inc., New York.

P.A. Longley and Michael Batty (2003):
            Advanced Spatial Analysis, ESRI Press, Redlands, California.
 
 
Reference Books:
D. O’Sulllivan and D. J. Unwin (2003):
Geographic Information Analysis. John Wiley and Sons, Inc., New York.

R. G. Congalton and K. Green (1999):
Accessing the Accuracy of Remotely Sensed Data. Lewis Publishers, Washington D.C.
 
Journals and Magazines:
International Journal of GIS
International Journal of Geoinformatics
GIS World
Photogrammetric Engineering and Remote Sensing
 
 
 
Evaluation Scheme:
The Final grades will be computed according to the following percentage distribution:
 
   Mid-Semester Examination 20%;
   Final Examination 50%;
   Assignments 15% and
   Miniproject 15%.
 
 Examination will be closed book.
 
Instructor(s):
SECTION NAME