The objectives of this course are to provide knowledge about how physical properties change as a function of size of materials from the perspective of characterization and to make students understand various techniques used to explore the nanomaterials including how to analyze data once obtained from a machine or tool.

The student on completion of this course would be able to: 

• Distinguish between standard analysis of materials and analysis of nanoscale materials
• Acquire practical applications of nanometrology and its importance
• Analyze the appropriate methods for nanomaterials and devices
• Innovate new characterization tools or methods

None.

I. Electron Probe Methods

1. Electron interaction with matter

2. Scanning electron microscopy (SEM)

3. Transmission electron microscopy (TEM) and electron diffraction

4. Auger electron microscopy (AEM)

 II. Scanning Probe Methods

1. Atomic force microscopy (AFM)

2. Scanning tunneling microscopy (STM)

 III. Photon Probe Methods

1. UV-visible-NIR and fluorescence spectroscopy

2. Raman spectroscopy and surface enhanced Raman (SERS)

3. X-ray diffraction (XRD)

4. X-ray fluorescence (XRF)

5. Infrared spectroscopy (FTIR)

6. Photon correlation spectroscopy (DLS)

 IV. Thermodynamic Methods

1. Brunhauer-Emmett-Teller (BET)

2. Differential scanning calorimetry (DSC)

3. Thermal gravimetric analysis (TGA)

4. Tensiometry for water contact angle (WCA)

 V. Nanometrology

1. Introduction to nanometrology

2. Statistical tools

3. Standards, calibration and tolerances

4. Accuracy, reliability and SI units

5. Heisenberg uncertainty and quantum triangle

6. New instrumentation and measurement techniques for nanomaterials

1. Vitha, M. F. (2015). Spectroscopy: Principles and Instrumentation. Hoboken, New Jersey: John Wiley & Sons.
2. Leach, R. (2014). Fundamental Principles of Engineering Nanometrology, 2nd Edition. Oxford: Elsevier.

1. Amelinckx, S., van Dyck, D., van Landuyt, J., & van Tendeloo, G. (2008). Electron Microscopy: Principles and Fundamentals. Weinheim: John Wiley & Sons.
2. Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Berlin: Springer.
3. Hammond, C. (2015). The Basics of Crystallography and Diffraction, 4th Edition. Oxford, UK: Oxford University Press.
4. Tantra, R. (2016). Nanomaterial Characterization: An Introduction. Hoboken, New Jersey: Wiley.
5. Bhagyaraj, S. M., Oluwafemi, O. S., Kalarikkal, N., & Thomas, S. (2018). Characterization of Nanomaterials: Advances and Key Technologies. Duxford, UK: Elsevier.
6. Thomas, S., Thomas, R., Zachariah, A. K., & Kumar, R. (2017). Spectroscopic Methods for Nanomaterials Characterization. Amsterdam: Elsevier.
7. Da Róz, A. L., Ferreira, M., Leite, F. L., & Oliveira Jr., O. N. (2017). Nanocharacterization Techniques. Oxford, UK: Elsevier.
8. Kirkland, A. I., & Haigh, S. J. (2015). Cambridge, UK: Royal Society of Chemistry.

1. Materials Characterization, Elsevier
2. Materials Today, Elsevier
3. Materials Science in Semiconductor Processing, Elsevier
4. Advanced Materials, Wiley
5. Nature Materials, Nature

Lecture hours = 45 h

Assignments & Practice Problems= 20 h

Class discussions = 10 h

Self-study = 105 h

Teaching and learning methods include lectures, class discussions, video presentations and assignments to understand the working principles of various tools and analyze data obtained from them. Practical examples will be presented in the class to easily grasp the concepts and practice problems will be provided.

The final grade will be computed from the following constituent parts: Quizzes (15%), Mid-term exam (30%), Final exam (40%), and Assignments (15%). Closed-book examination is used for both mid-term and final exam.

An “A” would be awarded if a student can demonstrate clear understanding of the knowledge learned in class as well as from the assignments and literature reviews. A “B” would be awarded if a student can understand the basic principles of the knowledge learned in class, from the assignments and from literature reviews, and show overall understanding of all the given topics. A “C” would be given if a student can understand partially the basic principles of the knowledge learned in class, from the assignments and from literature reviews, but meets below average expectation on both knowledge acquired and analysis. A “D” would be given if a student shows lack of understanding of the topics presented in the course.